diff options
author | Tom Rini <trini@konsulko.com> | 2020-04-16 13:45:03 -0400 |
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committer | Tom Rini <trini@konsulko.com> | 2020-04-16 13:45:03 -0400 |
commit | f51b4bcf61c9aa7994138a4a417488c1fbdb47cd (patch) | |
tree | 4f536d0892be1359f2cf02bfe366b56bef83bf28 /test/dm/test-fdt.c | |
parent | dba0a6ae1907bbff3ebda06e4874d006f10db1bb (diff) | |
parent | b0dcc87106464c3fc019e3771378a092fd32ebdb (diff) |
Merge tag 'dm-pull-10apr20-take2' of git://git.denx.de/u-boot-dm
Functions for reading indexed values from device tree
Enhancements to 'dm' command
Log test enhancements and syslog driver
DM change to read parent ofdata before children
Minor fixes
Diffstat (limited to 'test/dm/test-fdt.c')
-rw-r--r-- | test/dm/test-fdt.c | 66 |
1 files changed, 65 insertions, 1 deletions
diff --git a/test/dm/test-fdt.c b/test/dm/test-fdt.c index 75ae08081c..a56275aef9 100644 --- a/test/dm/test-fdt.c +++ b/test/dm/test-fdt.c @@ -255,7 +255,7 @@ static int dm_test_fdt(struct unit_test_state *uts) int ret; int i; - ret = dm_scan_fdt(gd->fdt_blob, false); + ret = dm_extended_scan_fdt(gd->fdt_blob, false); ut_assert(!ret); ret = uclass_get(UCLASS_TEST_FDT, &uc); @@ -867,6 +867,7 @@ static int dm_test_read_int(struct unit_test_state *uts) u32 val32; s32 sval; uint val; + u64 val64; ut_assertok(uclass_first_device_err(UCLASS_TEST_FDT, &dev)); ut_asserteq_str("a-test", dev->name); @@ -891,10 +892,48 @@ static int dm_test_read_int(struct unit_test_state *uts) ut_assertok(dev_read_u32u(dev, "uint-value", &val)); ut_asserteq(-1234, val); + ut_assertok(dev_read_u64(dev, "int64-value", &val64)); + ut_asserteq_64(0x1111222233334444, val64); + + ut_asserteq_64(-EINVAL, dev_read_u64(dev, "missing", &val64)); + ut_asserteq_64(6, dev_read_u64_default(dev, "missing", 6)); + + ut_asserteq_64(0x1111222233334444, + dev_read_u64_default(dev, "int64-value", 6)); + return 0; } DM_TEST(dm_test_read_int, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); +static int dm_test_read_int_index(struct unit_test_state *uts) +{ + struct udevice *dev; + u32 val32; + + ut_assertok(uclass_first_device_err(UCLASS_TEST_FDT, &dev)); + ut_asserteq_str("a-test", dev->name); + + ut_asserteq(-EINVAL, dev_read_u32_index(dev, "missing", 0, &val32)); + ut_asserteq(19, dev_read_u32_index_default(dev, "missing", 0, 19)); + + ut_assertok(dev_read_u32_index(dev, "int-array", 0, &val32)); + ut_asserteq(5678, val32); + ut_assertok(dev_read_u32_index(dev, "int-array", 1, &val32)); + ut_asserteq(9123, val32); + ut_assertok(dev_read_u32_index(dev, "int-array", 2, &val32)); + ut_asserteq(4567, val32); + ut_asserteq(-EOVERFLOW, dev_read_u32_index(dev, "int-array", 3, + &val32)); + + ut_asserteq(5678, dev_read_u32_index_default(dev, "int-array", 0, 2)); + ut_asserteq(9123, dev_read_u32_index_default(dev, "int-array", 1, 2)); + ut_asserteq(4567, dev_read_u32_index_default(dev, "int-array", 2, 2)); + ut_asserteq(2, dev_read_u32_index_default(dev, "int-array", 3, 2)); + + return 0; +} +DM_TEST(dm_test_read_int_index, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); + /* Test iteration through devices by drvdata */ static int dm_test_uclass_drvdata(struct unit_test_state *uts) { @@ -953,3 +992,28 @@ static int dm_test_first_child_probe(struct unit_test_state *uts) return 0; } DM_TEST(dm_test_first_child_probe, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); + +/* Test that ofdata is read for parents before children */ +static int dm_test_ofdata_order(struct unit_test_state *uts) +{ + struct udevice *bus, *dev; + + ut_assertok(uclass_find_first_device(UCLASS_I2C, &bus)); + ut_assertnonnull(bus); + ut_assert(!(bus->flags & DM_FLAG_PLATDATA_VALID)); + + ut_assertok(device_find_first_child(bus, &dev)); + ut_assertnonnull(dev); + ut_assert(!(dev->flags & DM_FLAG_PLATDATA_VALID)); + + /* read the child's ofdata which should cause the parent's to be read */ + ut_assertok(device_ofdata_to_platdata(dev)); + ut_assert(dev->flags & DM_FLAG_PLATDATA_VALID); + ut_assert(bus->flags & DM_FLAG_PLATDATA_VALID); + + ut_assert(!(dev->flags & DM_FLAG_ACTIVATED)); + ut_assert(!(bus->flags & DM_FLAG_ACTIVATED)); + + return 0; +} +DM_TEST(dm_test_ofdata_order, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); |